Armand Beyer Globalfoundries Fab 1 Biography Publications Institution JoVE Articles Armand Beyer has not added a biography. If you are Armand Beyer and would like to personalize this page please email our Author Liaison for assistance. Publications We haven't found any publications for Armand Beyer In Situ Time-dependent Dielectric Breakdown in the Transmission Electron Microscope: A Possibility to Understand the Failure Mechanism in Microelectronic Devices Zhongquan Liao1,2, Martin Gall1, Kong Boon Yeap1,3, Christoph Sander1, André Clausner1, Uwe Mühle1, Jürgen Gluch1, Yvonne Standke1, Oliver Aubel4, Armand Beyer4, Meike Hauschildt4, Ehrenfried Zschech1,2 1Fraunhofer Institute for Ceramic Technologies and Systems, 2Dresden Center for Nanoanalysis, Technische Universität Dresden, 3Globalfoundries Fab 8, 4Globalfoundries Fab 1 JoVE 52447 Engineering
In Situ Time-dependent Dielectric Breakdown in the Transmission Electron Microscope: A Possibility to Understand the Failure Mechanism in Microelectronic Devices Zhongquan Liao1,2, Martin Gall1, Kong Boon Yeap1,3, Christoph Sander1, André Clausner1, Uwe Mühle1, Jürgen Gluch1, Yvonne Standke1, Oliver Aubel4, Armand Beyer4, Meike Hauschildt4, Ehrenfried Zschech1,2 1Fraunhofer Institute for Ceramic Technologies and Systems, 2Dresden Center for Nanoanalysis, Technische Universität Dresden, 3Globalfoundries Fab 8, 4Globalfoundries Fab 1 JoVE 52447 Engineering
