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JoVE Journal
Engineering

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All-electronic Nanosecond-resolved Scanning Tunneling Microscopy
 

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

Article DOI: 10.3791/56861-v 11:33 min January 19th, 2018
January 19th, 2018

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