Armand Beyer

Globalfoundries Fab 1

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संचरण इलेक्ट्रॉन माइक्रोस्कोप में सीटू समय पर निर्भर ढांकता हुआ टूटने में: एक संभावना microelectronic उपकरणों में विफलता तंत्र को समझने

1Fraunhofer Institute for Ceramic Technologies and Systems, 2Dresden Center for Nanoanalysis, Technische Universität Dresden, 3Globalfoundries Fab 8, 4Globalfoundries Fab 1

 Engineering