Armand Beyer

Globalfoundries Fab 1

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In Situ in funzione del tempo di rottura dielettrico nel Transmission Electron Microscope: A Con possibilità di capire il meccanismo Fallimento in dispositivi microelettronici

1Fraunhofer Institute for Ceramic Technologies and Systems, 2Dresden Center for Nanoanalysis, Technische Universität Dresden, 3Globalfoundries Fab 8, 4Globalfoundries Fab 1

 Engineering