Articles by Chih-Pong Huang in JoVE
probing C Mon-Shu Ho1, Chih-Pong Huang2, Jyun-Hwei Tsai3, Che-Fu Chou1, Wen-Jay Lee3 1Department of Physics and Institute of Nanoscience, National Chung Hsing University, 2Metallurgy Section, Materials & Electro-Optics Research Division, National Chung-Shan Institute of Science and Technology, 3National Center for High-Performance Computing
Other articles by Chih-Pong Huang on PubMed
Investigation of Fullerene Embedded Silicon Surfaces with Scanning Probe Microscopy Journal of Nanoscience and Nanotechnology. Nov, 2010 | Pubmed ID: 21137884 This study examines the intramolecular structures of individual fullerene molecules on a Si(111)-7 x 7 surface using an ultra-high vacuum scanning tunneling microscope. This study also discusses possible configurations of fullerene molecules with related orientations and electronic states of fullerene. A self-assembled layer of fullerene on a Si(111) surface is produced using special annealing treatments. The resulting electronic states and band gap energy can be estimated from I-V curves. Finally the field emission parameters, such as turn-on field and field enhancement factor beta, are determined using a traditional detecting system.