David Mayerich

Department of Electrical and Computer Engineering

University of Houston

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나이프 - 에지 스캐닝 현미경에 대한 표본 준비, 이미징 및 분석 프로토콜

1Department of Computer Science and Engineering, Texas A&M University, 2Beckman Institute for Advanced Science and Technology, University of Illinois, 3Department of Electrical and Computer Engineering, Kettering University, 43Scan, 5Department of Veterinary Integrative Biosciences, Texas A&M University

JoVE 3248