Dilworth Y. Parkinson Advanced Light Source Lawrence Berkeley National Laboratory Biography Publications Institution JoVE Articles Dilworth Y. Parkinson has not added a biography. If you are Dilworth Y. Parkinson and would like to personalize this page please email our Author Liaison for assistance. Publications Correlative Microscopy Methods That Maximize Specimen Fidelity and Data Completeness, and Improve Molecular Localization Capabilities Journal of Structural Biology. Mar, 2013 | Pubmed ID: 23531637 A Comparative Study of X-ray Tomographic Microscopy on Shales at Different Synchrotron Facilities: ALS, APS and SLS Journal of Synchrotron Radiation. Jan, 2013 | Pubmed ID: 23254671 Real-time Quantitative Imaging of Failure Events in Materials Under Load at Temperatures Above 1,600 °C Nature Materials. Jan, 2013 | Pubmed ID: 23223124 Nanoimaging Cells Using Soft X-ray Tomography Methods in Molecular Biology (Clifton, N.J.). 2013 | Pubmed ID: 23086890 Automatic Alignment and Reconstruction of Images for Soft X-ray Tomography Journal of Structural Biology. Feb, 2012 | Pubmed ID: 22155289 Quantitative 3-D Imaging of Eukaryotic Cells Using Soft X-ray Tomography Journal of Structural Biology. Jun, 2008 | Pubmed ID: 18387313 Measuring Electronic Coupling in the Reaction Center of Purple Photosynthetic Bacteria by Two-color, Three-pulse Photon Echo Peak Shift Spectroscopy The Journal of Physical Chemistry. B. Jun, 2007 | Pubmed ID: 17530796 Anti-correlated Spectral Motion in Bisphthalocyanines: Evidence for Vibrational Modulation of Electronic Mixing The Journal of Physical Chemistry. A. Dec, 2005 | Pubmed ID: 16331930 Probing Correlated Spectral Motion: Two-color Photon Echo Study of Nile Blue The Journal of Chemical Physics. Aug, 2005 | Pubmed ID: 16108677 Fourier Transform Infrared Studies of Heterogeneity, Photodegradation, and Lignin/hemicellulose Ratios Within Hardwoods and Softwoods Applied Spectroscopy. Nov, 2004 | Pubmed ID: 15606929 Two-dimensional Optical Spectroscopy: Two-color Photon Echoes of Electronically Coupled Phthalocyanine Dimers The Journal of Chemical Physics. Feb, 2004 | Pubmed ID: 15268397 С использованием синхротронного излучения микротомография Расследования многомасштабном Трехмерные Микроэлектронные пакеты Holly D. Carlton1, John W. Elmer1, Yan Li2, Mario Pacheco2, Deepak Goyal2, Dilworth Y. Parkinson3, Alastair A. MacDowell3 1Materials Engineering Division, Lawrence Livermore National Laboratory, 2Assembly Test and Technology Development Failure Analysis Labs, Intel Corporation, 3Advanced Light Source, Lawrence Berkeley National Laboratory JoVE 53683 Engineering Анализ отказов батарей с использованием синхротронного основе жесткого рентгеновского микротомография Katherine J. Harry1,2, Dilworth Y. Parkinson3, Nitash P. Balsara2,4,5 1Department of Materials Science and Engineering, University of California Berkeley, 2Materials Science Division, Lawrence Berkeley National Laboratory, 3Advanced Light Source Division, Lawrence Berkeley National Laboratory, 4Department of Chemical and Biomolecular Engineering, University of California Berkeley, 5Environmental Energy Technology Division, Lawrence Berkeley National Laboratory Engineering Использование компьютерной томографии высокого разрешения для визуализации трехмерной структуры и функции сосудистой завод Andrew J. McElrone1,2, Brendan Choat3, Dilworth Y. Parkinson4, Alastair A. MacDowell4, Craig R. Brodersen5 1U.S. Department of Agriculture, 2Department of Viticulture and Enology, University of California - Davis, 3Hawkesbury Institute for the Environment, University of Western Sydney, 4Advanced Light Source, Lawrence Berkeley National Lab, 5Citrus Research & Education Center, University of Florida JoVE 50162 Biology
С использованием синхротронного излучения микротомография Расследования многомасштабном Трехмерные Микроэлектронные пакеты Holly D. Carlton1, John W. Elmer1, Yan Li2, Mario Pacheco2, Deepak Goyal2, Dilworth Y. Parkinson3, Alastair A. MacDowell3 1Materials Engineering Division, Lawrence Livermore National Laboratory, 2Assembly Test and Technology Development Failure Analysis Labs, Intel Corporation, 3Advanced Light Source, Lawrence Berkeley National Laboratory JoVE 53683 Engineering
Анализ отказов батарей с использованием синхротронного основе жесткого рентгеновского микротомография Katherine J. Harry1,2, Dilworth Y. Parkinson3, Nitash P. Balsara2,4,5 1Department of Materials Science and Engineering, University of California Berkeley, 2Materials Science Division, Lawrence Berkeley National Laboratory, 3Advanced Light Source Division, Lawrence Berkeley National Laboratory, 4Department of Chemical and Biomolecular Engineering, University of California Berkeley, 5Environmental Energy Technology Division, Lawrence Berkeley National Laboratory Engineering
Использование компьютерной томографии высокого разрешения для визуализации трехмерной структуры и функции сосудистой завод Andrew J. McElrone1,2, Brendan Choat3, Dilworth Y. Parkinson4, Alastair A. MacDowell4, Craig R. Brodersen5 1U.S. Department of Agriculture, 2Department of Viticulture and Enology, University of California - Davis, 3Hawkesbury Institute for the Environment, University of Western Sydney, 4Advanced Light Source, Lawrence Berkeley National Lab, 5Citrus Research & Education Center, University of Florida JoVE 50162 Biology
