Ellen Hieckmann

Institute of Applied Physics, Semiconductor Physics

Technische Universität Dresden

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Исчерпывающая характеристика протяженных дефектов в полупроводниковых материалах на растровом электронном микроскопе

1Institute of Applied Physics, Semiconductor Physics, Technische Universität Dresden, 2Institut für Strukturphysik, Technische Universität Dresden

 Engineering