Michael T. Postek Nanoscale Device Characterization Division, Physical Measurement Laboratory National Institute of Standards and Technology Biography Publications Institution JoVE Articles Michael T. Postek has not added a biography. If you are Michael T. Postek and would like to personalize this page please email our Author Liaison for assistance. Publications Innovative Approaches to Combat Healthcare-Associated Infections Using Efficacy Standards Developed Through Industry and Federal Collaboration Proceedings of SPIE--the International Society for Optical Engineering. 2018 | Pubmed ID: 31092964 Dielectric Spectroscopic Studies of Biological Material Evolution and Application to Paper Tappi Journal. 2018 | Pubmed ID: 30983693 Ionizing Radiation Processing and Its Potential in Advancing Biorefining and Nanocellulose Composite Materials Manufacturing Radiation Physics and Chemistry (Oxford, England : 1993). Feb, 2018 | Pubmed ID: 29230084 Update on Bio-Refining and Nanocellulose Composite Materials Manufacturing Proceedings of SPIE--the International Society for Optical Engineering. 2017 | Pubmed ID: 29225398 Comparison of Electron Imaging Modes for Dimensional Measurements in the Scanning Electron Microscope Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 08, 2016 | Pubmed ID: 27452278 Does Your SEM Really Tell the Truth?-How Would You Know? Part 4: Charging and Its Mitigation Proceedings of SPIE--the International Society for Optical Engineering. 2015 | Pubmed ID: 28663665 Nanomanufacturing Concerns About Measurements Made in the SEM Part IV: Charging and Its Mitigation Proceedings of SPIE--the International Society for Optical Engineering. 2015 | Pubmed ID: 28663664 Does Your SEM Really Tell the Truth? How Would You Know? Part 2 Scanning. May-Jun, 2014 | Pubmed ID: 24166540 Does Your SEM Really Tell the Truth?--How Would You Know? Part 1 Scanning. Nov-Dec, 2013 | Pubmed ID: 23427011 Modeling for Accurate Dimensional Scanning Electron Microscope Metrology: then and Now Scanning. May-Jun, 2011 | Pubmed ID: 21630286 Real-time Scanning Charged-particle Microscope Image Composition with Correction of Drift Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. Apr, 2011 | Pubmed ID: 21122194 Nanotip Electron Gun for the Scanning Electron Microscope Scanning. May-Jun, 2006 | Pubmed ID: 16878784 Two-dimensional Simulation and Modeling in Scanning Electron Microscope Imaging and Metrology Research Scanning. Jul-Aug, 2002 | Pubmed ID: 12166805 Interlaboratory Study on the Lithographically Produced Scanning Electron Microscope Magnification Standard Prototype Journal of Research of the National Institute of Standards and Technology. Jul-Aug, 1993 | Pubmed ID: 28053483 X-Ray Lithography Mask Metrology: Use of Transmitted Electrons in an SEM for Linewidth Measurement Journal of Research of the National Institute of Standards and Technology. Jul-Aug, 1993 | Pubmed ID: 28053482 Method Development for Contactless Resonant Cavity Dielectric Spectroscopic Studies of Cellulosic Paper Mary Kombolias1, Jan Obrzut2, Michael T. Postek3,4, Dianne L. Poster2, Yaw S. Obeng3 1Testing and Technical Services, Plant Operations, United States Government Publishing Office, 2Materials Measurement Laboratory, National Institute of Standards and Technology, 3Nanoscale Device Characterization Division, Physical Measurement Laboratory, National Institute of Standards and Technology, 4College of Pharmacy, University of South Florida JoVE 59991 Engineering
Method Development for Contactless Resonant Cavity Dielectric Spectroscopic Studies of Cellulosic Paper Mary Kombolias1, Jan Obrzut2, Michael T. Postek3,4, Dianne L. Poster2, Yaw S. Obeng3 1Testing and Technical Services, Plant Operations, United States Government Publishing Office, 2Materials Measurement Laboratory, National Institute of Standards and Technology, 3Nanoscale Device Characterization Division, Physical Measurement Laboratory, National Institute of Standards and Technology, 4College of Pharmacy, University of South Florida JoVE 59991 Engineering