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表面附近的高速粒子图像测速
JoVE Journal
Ingenieurwesen
This content is Free Access.
JoVE Journal
Ingenieurwesen
High-speed Particle Image Velocimetry Near Surfaces
Please note that all translations are automatically generated.
Click here for the English version.
表面附近的高速粒子图像测速
DOI:
10.3791/50559-v
•
11:59 min
•
June 24, 2013
•
Louise Lu
,
Volker Sick
1
Department of Mechanical Engineering
,
University of Michigan
Kapitel
00:05
Titel
01:24
Preparation and Set-up
02:35
Optimizing the Set-up
04:30
Running the Experiment
06:53
Data Processing
09:57
Results: Transient Flow Near the Surface of a Flat Plate
11:25
Conclusion
Summary
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Automatische Übersetzung
研究瞬变流边界附近，使用高分辨率，高速粒子图像测速（PIV）的一个过程。 PIV是一种非侵入式测量技术适用于任何光学访问的流量通过优化多个参数的限制，例如图像和记录性能，激光表属性，和分析算法。
Tags
Particle Image Velocimetry
High-speed PIV
Transient Flow Measurement
Multi-dimensional Flow
Laser-based Imaging
Flow Visualization
Surface Flow
Flow Analysis
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