Nagoya Institute of Technology 1 article published in JoVE Engineering Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method Takato Asada1, Yoshihito Ichikawa1, Masashi Kato1,2 1Department of Electrical & Mechanical Engineering, Nagoya Institute of Technology, 2Frontier Research Institute for Material Science, Nagoya Institute of Technology As one of the important physical parameters in semiconductors, carrier lifetime is measured herein via a protocol employing the microwave photoconductivity decay method.
