Deutsches Elektronen-Synchrotron 1 article published in JoVE Engineering X-ray Beam Induced Current Measurements for Multi-Modal X-ray Microscopy of Solar Cells Christina Ossig1,3, Tara Nietzold2, Bradley West2, Mariana Bertoni2, Gerald Falkenberg1, Christian G. Schroer1,3, Michael E. Stuckelberger1 1Deutsches Elektronen-Synchrotron, 2School of Electrical, Computer and Energy Engineering, Arizona State University, 3Department Physik, Universität Hamburg A setup for X-ray beam induced current measurements at synchrotron beamlines is described. It unveils the nanoscale performance of solar cells and extends the suite of techniques for multi-modal X-ray microscopy. From wiring to signal-to-noise optimization, it is shown how to perform state-of-the-art XBIC measurements at a hard X-ray microprobe.
