Hamm-Lippstadt University of Applied Sciences 1 article published in JoVE Engineering In Depth Analyses of LEDs by a Combination of X-ray Computed Tomography (CT) and Light Microscopy (LM) Correlated with Scanning Electron Microscopy (SEM) Jörg Meyer1, Christian Thomas1, Frank Tappe1, Tekie Ogbazghi1 1Department Lippstadt, Hamm-Lippstadt University of Applied Sciences A workflow for comprehensive micro-characterization of active optical devices is outlined. It contains structural as well as functional investigations by means of CT, LM and SEM. The method is demonstrated for a white LED which can be still be operated during characterization.
