Center for Advanced Energy Studies 3 articles published in JoVE Engineering Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid Ashton E. Enrriques1, Sean Howard2, Raju Timsina3, Nawal K. Khadka3, Amber N. Hoover4, Allison E. Ray5, Ling Ding4, Chioma Onwumelu6, Stephan Nordeng6, Laxman Mainali3,7, Gunes Uzer2, Paul H. Davis1,8 1Micron School of Materials Science & Engineering, Boise State University, 2Department of Mechanical & Biomedical Engineering, Boise State University, 3Department of Physics, Boise State University, 4Energy and Environmental Science and Technology, Idaho National Laboratory, 5Science and Technology, Idaho National Laboratory, 6Harold Hamm School of Geology & Geological Engineering, University of North Dakota, 7Biomolecular Sciences Graduate Program, Boise State University, 8Center for Advanced Energy Studies Quantifying the contact area and force applied by an atomic force microscope (AFM) probe tip to a sample surface enables nanoscale mechanical property determination. Best practices to implement AFM cantilever-based nanoindentation in air or fluid on soft and hard samples to measure elastic modulus or other nanomechanical properties are discussed. Engineering Optimizing Magnetic Force Microscopy Resolution and Sensitivity to Visualize Nanoscale Magnetic Domains Audrey C. Parker*1, Olivia O. Maryon*1, Mojtaba T. Kaffash2, M. Benjamin Jungfleisch2, Paul H. Davis1,3 1Micron School of Materials Science & Engineering, Boise State University, 2Department of Physics and Astronomy, University of Delaware, 3Center for Advanced Energy Studies Magnetic force microscopy (MFM) employs a vertically magnetized atomic force microscopy probe to measure sample topography and local magnetic field strength with nanoscale resolution. Optimizing MFM spatial resolution and sensitivity requires balancing decreasing lift height against increasing drive (oscillation) amplitude, and benefits from operating in an inert atmosphere glovebox. Engineering Co-localizing Kelvin Probe Force Microscopy with Other Microscopies and Spectroscopies: Selected Applications in Corrosion Characterization of Alloys Olivia O. Maryon*1, Corey M. Efaw*1, Frank W. DelRio2, Elton Graugnard1,3, Michael F. Hurley1,3, Paul H. Davis1,3 1Micron School of Materials Science & Engineering, Boise State University, 2Material, Physical, and Chemical Sciences Center, Sandia National Laboratories, 3Center for Advanced Energy Studies Kelvin probe force microscopy (KPFM) measures surface topography and differences in surface potential, while scanning electron microscopy (SEM) and associated spectroscopies can elucidate surface morphology, composition, crystallinity, and crystallographic orientation. Accordingly, the co-localization of SEM with KPFM can provide insight into the effects of nanoscale composition and surface structure on corrosion.
