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Journal / Neuroscience / Gericht Ion Beam Frezen en Scanning Electron…
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Neuroscience

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JoVE Journal Neuroscience
Gericht Ion Beam Frezen en Scanning Electron Microscopy van hersenweefsel
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Gericht Ion Beam Frezen en Scanning Electron Microscopy van hersenweefsel

Article DOI: 10.3791/2588-v • 08:58 min • July 6th, 2011
July 6th, 2011 •
1, 1, 1
1Centre of interdisciplinary electron microscopy, École Polytechnique Fédérale de Lausanne

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Dit protocol beschrijft hoe hars ingebed hersenweefsel kan worden voorbereid en afgebeeld in de drie dimensies in de gerichte ion beam, scanning electronen microscoop.

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Neurowetenschappen Gericht ion beam scanning elektronenmicroscopie FIB
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