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JoVE Journal
Neuroscience

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Gericht Ion Beam Frezen en Scanning Electron Microscopy van hersenweefsel
 
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Gericht Ion Beam Frezen en Scanning Electron Microscopy van hersenweefsel

Article DOI: 10.3791/2588
July 6th, 2011

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Summary July 6th, 2011

Please note that all translations are automatically generated.

Click here for the English version.

Dit protocol beschrijft hoe hars ingebed hersenweefsel kan worden voorbereid en afgebeeld in de drie dimensies in de gerichte ion beam, scanning electronen microscoop.

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