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Engineering

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Measurement of Coherence Decay in GaMnAs Using Femtosecond Four-wave Mixing
 
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Measurement of Coherence Decay in GaMnAs Using Femtosecond Four-wave Mixing

Article DOI: 10.3791/51094-v 15:59 min December 3rd, 2013
December 3rd, 2013

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Summary

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Click here for the English version.

The technique of femtosecond four-wave mixing is described, including spectrally-resolved and time-resolved configurations. We illustrate the utility of this technique for the investigation of crucial physical properties in the III-V diluted magnetic semiconductors, afforded by its nonlinearity and high temporal resolution.

Tags

Femtosecond Four-wave Mixing Coherence Decay GaMnAs Diluted Magnetic Semiconductors Spin-flip Scattering Spectrally-resolved Time-resolved Zero-background Autocorrelation Techniques Pulse Optimization Etching Process Temporal Resolution Carrier-mediated Ferromagnetism (s,p)-d Hybridization Linear Spectroscopy Techniques Nonlinearity Defect-related Contributions Time Scale For Coherence Decay Semiconductor Systems Next Generation Electronics Optoelectronics
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