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Journal / Biology / Cryo-elektron mikroskopi prøven forberedelse ved…
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Biology

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Cryo-elektron mikroskopi prøven forberedelse ved hjelp av en Focused Ion Beam
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Cryo-elektron mikroskopi prøven forberedelse ved hjelp av en Focused Ion Beam

Article DOI: 10.3791/51463-v • 10:54 min • July 26th, 2014
July 26th, 2014 •
1,4, 3, 2, 1
1Department of Engineering Sciences, Uppsala University, 2Gatan Inc., 3Department of Microbiology, Swedish University of Agricultural Sciences, 4Physics Department, University of Oslo

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Cryo elektronmikroskop, enten Scanning (SEM) eller Transmission (TEM), er mye brukt for karakterisering av biologiske prøver eller andre materialer med høyt vanninnhold en. En SEM / Fokusert Ion Beam (FIB) brukes til å identifisere funksjoner av interesse i prøver og trekke en tynn, elektron-transparent lamell for overføring til en Cryo-TEM.

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Bioteknologi Cryoelectron Mikros miljø-og biovitenskap (General) Cryo-mikroskopi Fokusert ion stråle prøveopparbeidelse TEM FIB
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