Journal
/
Engineering
/
In Situ Tijdafhankelijk Diëlektrische Breakdownin de Transmission Electron Microscope: een mogelijkheid om het faalmechanisme in Microelectronic Devices Begrijp…
JoVE Journal
Engineering
Engineering
A subscription to JoVE is required to view this content.
In Situ Tijdafhankelijk Diëlektrische Breakdown in de Transmission Electron Microscope
The JoVE video player is compatible with HTML5 and Adobe Flash. Older browsers that do not support HTML5 and the H.264 video codec will still use a Flash-based video player. We recommend downloading the newest version of Flash here, but we support all versions 10 and above.
If that doesn't help, please let us know.
Unable to load video. Please check your Internet connection and reload this page. If the problem continues, please let us know and we'll try to help.
An unexpected error occurred. Please check your Internet connection and reload this page. If the problem continues, please let us know and we'll try to help.
Click here for the English version
Article
DOI:
10.3791/52447-v
•
09:26 min
•
June 26th, 2015
In Situ Tijdafhankelijk Diëlektrische Breakdown in de Transmission Electron Microscope: een mogelijkheid om het faalmechanisme in Microelectronic Devices Begrijp
June 26th, 2015
•