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Journal / Engineering / Кремний Металл-оксид-полупроводниковых квантовых…
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Engineering

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JoVE Journal Engineering
Кремний Металл-оксид-полупроводниковых квантовых точек для одного электрона Перекачивание
Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
Journal (Engineering)
Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
Etalon Characterization
Journal (Engineering)
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Кремний Металл-оксид-полупроводниковых квантовых точек для одного электрона Перекачивание

Article DOI: 10.3791/52852-v • 14:58 min • June 3rd, 2015
June 3rd, 2015 •
1, 2, 1, 1, 2, 1
1School of Electrical Engineering & Telecommunications, University of New South Wales, 2QCD Labs, COMP Centre of Excellence, Department of Applied Physics, Aalto University

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Инженерная выпуск 100 физики кремний квантовые точки квантовые Метрология наноэлектроника обязанность Насосная
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