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光增强氢氟酸钝化:一个敏感的技术检测散装硅缺陷
 
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光增强氢氟酸钝化:一个敏感的技术检测散装硅缺陷

Article DOI: 10.3791/53614-v 09:15 min January 4th, 2016
January 4th, 2016

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Summary

Please note that all translations are automatically generated.

Click here for the English version.

一个RT液体表面钝化技术研究体硅缺陷的重组活性描述。对于该技术是成功的,三个关键的步骤是必需的:(ⅰ)化学清洗和硅的蚀刻,硅的(ⅱ)浸没在15%的氢氟酸和(iii)照明1分钟。

Tags

工程,第107,散装寿命,缺陷,氢氟酸,照明,钝化,光电导,重组。
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