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Usando Synchrotron Radiation microtomografia para investigar Multi-escala Pacotes de microeletrônicos tridimensionais
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Usando Synchrotron Radiation microtomografia para investigar Multi-escala Pacotes de microeletrônicos tridimensionais

Article DOI: 10.3791/53683
April 13th, 2016 •
1, 1, 2, 2, 2, 3, 3
1Materials Engineering Division, Lawrence Livermore National Laboratory, 2Assembly Test and Technology Development Failure Analysis Labs, Intel Corporation, 3Advanced Light Source, Lawrence Berkeley National Laboratory

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April 13th, 2016

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Para este estudo radiação sincrotrão micro-tomografia, uma técnica de imagem não destrutivo tridimensional, é empregue para investigar um pacote de microelectrónica inteira com uma área de secção transversal de 16 x 16 mm. Devido ao alto fluxo e brilho do sincrotrão a amostra foi fotografada em apenas 3 min com uma resolução espacial de 8,7 m.

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