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JoVE Journal
Engineering

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Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics
 

Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics

Article DOI: 10.3791/54235-v 13:58 min September 28th, 2016
September 28th, 2016

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