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sondagem C<sub> 84</sub> -embedded Si substrato utilizando Scanning Probe Microscopy e Dinâmica Molecular
JoVE Journal
Engineering
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JoVE Journal Engineering
Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics

sondagem C<sub> 84</sub> -embedded Si substrato utilizando Scanning Probe Microscopy e Dinâmica Molecular

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13:58 min

September 28, 2016

DOI:

13:58 min
September 28, 2016

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Summary

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This paper reports the nanomaterial fabrication of a fullerene Si substrate inspected and verified by nanomeasurements and molecular dynamic simulation.

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