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JoVE Journal
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牺牲纳米颗粒使用删除散粒噪声的影响通过电子束光刻装配式接触孔
 
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牺牲纳米颗粒使用删除散粒噪声的影响通过电子束光刻装配式接触孔

Article DOI: 10.3791/54551-v 07:51 min February 12th, 2017
February 12th, 2017

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Summary

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Click here for the English version.

均匀尺寸的纳米颗粒可以除去在有机玻璃图案化的接触孔尺寸(PMMA)光致抗蚀剂膜通过电子束(E-束)光刻波动。该方法包括静电漏斗中的接触孔中心并沉积的纳米颗粒,随后光致抗蚀剂回流和等离子体和湿法蚀刻步骤。

Tags

工程,第120,电子束/ EUV光刻,静电漏斗,抗蚀剂回流,等离子体蚀刻
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