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Journal / Chemistry / Kvantificere X-Ray fluorescens Data ved hjælp af…
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Kvantificere X-Ray fluorescens Data ved hjælp af kort
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Kvantificere X-Ray fluorescens Data ved hjælp af kort

Article DOI: 10.3791/56042-v • 14:59 min • February 17th, 2018
February 17th, 2018 •
1, 2, 2, 3, 3, 2
1School for Engineering of Matter, Transport, and Energy, Arizona State University, 2School of Electrical, Computer, and Energy Engineering, Arizona State University, 3Advanced Photon Source, Argonne National Laboratory

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Her viser vi brugen af X-ray fluorescens montering software, kort, lavet af Argonne National Laboratory for kvantitativ bestemmelse af Fluorescens mikroskopi data. De kvantitative data, at resultaterne er nyttige for at forstå elementært distribution og støkiometriske forhold inden for en prøve af interesse.

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Kemi sag 132 X-ray fluorescens kvantificering synchrotron montering solcelle defekter urenheder software kort
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