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10:12 min
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June 19, 2018
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Vi beskriver en beamline setup tänkt att utföra snabba tvådimensionell x-ray fluorescens och röntgen microdiffraction kartläggning av enskilda kristaller eller pulver prover med hjälp av Laue (polykromatiska strålning) eller pulver (monokromatisk strålning) diffraktion. De resulterande kartorna ger information om stam, orientering, fas distribution och plastisk deformation.
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Cite this Article
Stan, C. V., Tamura, N. Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples. J. Vis. Exp. (136), e57874, doi:10.3791/57874 (2018).
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