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Journal / Chemistry / ToF-SIMSおよびXPS分析用ナノ粒子の調製
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Chemistry

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JoVE Journal Chemistry
ToF-SIMSおよびXPS分析用ナノ粒子の調製
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ToF-SIMSおよびXPS分析用ナノ粒子の調製

Article DOI: 10.3791/61758-v • 06:24 min • September 13th, 2020
September 13th, 2020 •
1, 1, 1, 2, 2, 2, 2, 2
1Division of Surface Analysis and Interfacial Chemistry, Federal Institute for Material Research and Testing (BAM), 2Department of Chemical and Product Safety, German Federal Institute for Risk Assessment (BfR)

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表面分析用のナノ粒子を調製するための多くの異なる手順(ドロップキャスティング、スピンコーティング、粉末からの堆積、およびcryofixation)が提示されています。各方法の課題、機会、応用例、特に様々な調製方法による表面特性の変化について議論する。

Tags

化学、問題163、ナノ粒子、サンプル調製、表面分析、XPS、ToF-SIMS、スピンコーティング、ドロップキャスティング、クライオフィクセ化
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