Waiting
Login processing...

Trial ends in Request Full Access Tell Your Colleague About Jove
Journal / Engineering / 通过冷冻聚焦离子束铣削与扫描电子显微镜和光谱学耦合，对液固界面进行纳米级表征…
JoVE Journal
Engineering

A subscription to JoVE is required to view this content.

JoVE Journal Engineering
通过冷冻聚焦离子束铣削与扫描电子显微镜和光谱学耦合，对液固界面进行纳米级表征
Characterization of Full Set Material Constants and Their Temperature Dependence for Piezoelectric Materials Using Resonant Ultrasound Spectroscopy
Journal (Engineering)
Characterization of Full Set Material Constants and Their Temperature Dependence for Piezoelectric Materials Using Resonant Ultrasound Spectroscopy
Energy Dispersive X-ray Tomography for 3D Elemental Mapping of Individual Nanoparticles
Journal (Engineering)
Energy Dispersive X-ray Tomography for 3D Elemental Mapping of Individual Nanoparticles
 
Click here for the English version

通过冷冻聚焦离子束铣削与扫描电子显微镜和光谱学耦合，对液固界面进行纳米级表征

Article DOI: 10.3791/61955-v • 11:03 min • July 14th, 2022
July 14th, 2022 •
1, 1, 1,2
1School of Applied and Engineering Physics, Cornell University, 2Kavli Institute at Cornell for Nanoscale Science

Chapters

Summary
Automatic Translation

Please note that all translations are automatically generated.

Click here for the English version.

低温聚焦离子束（FIB）和扫描电子显微镜（SEM）技术可以为完整固液界面的化学和形态提供关键见解。详细介绍了制备此类界面的高质量能量色散X射线（EDX）光谱图的方法，重点是储能器件。

Tags

工程学，第185期，低温FIB，低温SEM，能量色散X射线光谱，固液界面，储能器件
Read Article

Get cutting-edge science videos from JoVE sent straight to your inbox every month.

Waiting X
Simple Hit Counter