JoVE Journal (Engineering)
In Situ Time-dependent Dielectric Breakdown in the Transmission Electron Microscope: A Possibility to Understand the Failure Mechanism in Microelectronic Devices
By continuing to use our website or clicking “Continue”, you are agreeing to accept our cookies.
Thank you for taking us up on our offer of free access to JoVE Education until June 15th. Your access has now expired.
If you would like to continue using JoVE, please let your librarian know as they consider the most appropriate subscription options for your institution’s academic community.
Provide feedback to your librarian
If you have any questions, please do not hesitate to reach out to our customer success team.