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JoVE Journal Bioengineering
Nanotopology van Celadhesie op variabele-Angle Total Internal Reflection fluorescentie microscopie (VA-TIRFM)
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Nanotopology van Celadhesie op variabele-Angle Total Internal Reflection fluorescentie microscopie (VA-TIRFM)

Article DOI: 10.3791/4133-v • 09:15 min • October 2nd, 2012
October 2nd, 2012 •
1, 1, 1, 1
1Hochschule Aalen, Institut für Angewandte Forschung

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Topologie van celhechting op een substraat wordt gemeten met nanometer precisie door variabele hoek totale interne reflectie fluorescentiemicroscopie (VA-TIRFM).

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Bioengineering Cellular Biology Moleculaire Biologie Biofysica Natuurkunde Celadhesie fluorescentie microscopie TIRFM nanotopology
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