Waiting
Login processing...

Trial ends in Request Full Access Tell Your Colleague About Jove
Journal / Chemistry / In Situ SIMS og IR-spektroskopi veldefinerede…
JoVE Journal
Chemistry

A subscription to JoVE is required to view this content.

JoVE Journal Chemistry
In Situ SIMS og IR-spektroskopi veldefinerede Overflader Udarbejdet af Soft Landing af Mass udvalgte ioner
Flow-pattern Guided Fabrication of High-density Barcode Antibody Microarray
Journal (Chemistry)
Flow-pattern Guided Fabrication of High-density Barcode Antibody Microarray
Reactive Inkjet Printing and Propulsion Analysis of Silk-based Self-propelled Micro-stirrers
Journal (Chemistry)
Reactive Inkjet Printing and Propulsion Analysis of Silk-based Self-propelled Micro-stirrers
 
Click here for the English version

In Situ SIMS og IR-spektroskopi veldefinerede Overflader Udarbejdet af Soft Landing af Mass udvalgte ioner

Article DOI: 10.3791/51344-v • 10:22 min • June 16th, 2014
June 16th, 2014 •
1, 1, 1
1Physical Sciences Division, Pacific Northwest National Laboratory

Chapters

Summary
Automatic Translation

Please note that all translations are automatically generated.

Click here for the English version.

Blød landing af masse-udvalgte ioner på overflader er en kraftfuld metode til den meget kontrollerede udarbejdelse af nye materialer. Kombineret med analyse af in situ sekundær ion massespektrometri (SIMS) og infrarød refleksion absorption spektroskopi (IRRAS), blød landing giver hidtil usete indsigt i samspillet mellem veldefinerede arter med overflader.

Tags

Kemi blød landing masse udvalgte ioner elektronstråler sekundær ion-massespektrometri infrarød spektroskopi organmetalliske katalyse
Read Article

Get cutting-edge science videos from JoVE sent straight to your inbox every month.

Waiting X
Simple Hit Counter