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Cryo-Microscopia Eletrônica de Preparação de Amostras por meio de um Focused Ion Beam
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Cryo-Microscopia Eletrônica de Preparação de Amostras por meio de um Focused Ion Beam

Article DOI: 10.3791/51463-v • 10:54 min • July 26th, 2014
July 26th, 2014 •
1,4, 3, 2, 1
1Department of Engineering Sciences, Uppsala University, 2Gatan Inc., 3Department of Microbiology, Swedish University of Agricultural Sciences, 4Physics Department, University of Oslo

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Cryo Electron Microscópios, ou de varredura (MEV) ou de transmissão (TEM), são amplamente utilizados para a caracterização de amostras biológicas ou outros materiais com alto teor de água 1. A SEM / Focused Ion Beam (FIB) é usado para identificar características de interesse em amostras e extrair, uma lamela elétron-fina e transparente de transferência para um crio-TEM.

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Bioengenharia cryoelectron Microscopia Ciências Biológicas (Geral) Cryo-microscopia feixe de íons focalizados preparação da amostra MET FIB
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