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Journal / Engineering / 쿨롱 불순물 스캐닝 터널링 현미경 연구 게이트 - 조정 가능한 그래 핀 장치의…
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JoVE Journal Engineering
쿨롱 불순물 스캐닝 터널링 현미경 연구 게이트 - 조정 가능한 그래 핀 장치의 제작
Graphene-Assisted Quasi-van der Waals Epitaxy of AlN Film on Nano-Patterned Sapphire Substrate for Ultraviolet Light Emitting Diodes
Journal (Engineering)
Graphene-Assisted Quasi-van der Waals Epitaxy of AlN Film on Nano-Patterned Sapphire Substrate for Ultraviolet Light Emitting Diodes
Interactive and Visualized Online Experimentation System for Engineering Education and Research
Journal (Engineering)
Interactive and Visualized Online Experimentation System for Engineering Education and Research
 
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쿨롱 불순물 스캐닝 터널링 현미경 연구 게이트 - 조정 가능한 그래 핀 장치의 제작

Article DOI: 10.3791/52711-v • 11:42 min • July 24th, 2015
July 24th, 2015 •
1,2, 1, 1, 1, 1, 1,3, 1, 1, 1, 1, 1, 4, 4, 1,5,6, 1,5,6, 1,5,6
1Department of Physics, University of California at Berkeley, 2Department of Chemistry, University of California at Berkeley, 3Department of Chemical and Biomolecular Engineering, University of California at Berkeley, 4National Institute for Materials Science (Japan), 5Materials Sciences Division, Lawrence Berkeley National Laboratory, 6Kavli Energy NanoSciences Institute, University of California at Berkeley and Lawrence Berkeley National Laboratory

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공학 판 (101) 물리 그라 정전기 게이팅 주사 터널링 현미경 (STM) 쿨롱 불순물 화학 기상 증착 (CVD) 폴리 메틸 메타 크릴 레이트 (PMMA) 이동 와이어 본딩
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