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Träger Lebensdauer Messungen in Halbleitern durch die Mikrowellen-Photoconductivity-Decay-Methode
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Träger Lebensdauer Messungen in Halbleitern durch die Mikrowellen-Photoconductivity-Decay-Methode

Article DOI: 10.3791/59007-v • 07:38 min • April 18th, 2019
April 18th, 2019 •
1, 1, 1,2
1Department of Electrical & Mechanical Engineering, Nagoya Institute of Technology, 2Frontier Research Institute for Material Science, Nagoya Institute of Technology

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Als eines der wichtigen physikalischen Parameter in Halbleitern ist Träger Lebensdauer hierin über ein Protokoll mit der Mikrowelle Photoconductivity Zerfall Methode gemessen.

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Engineering Zeit Ausgabe 146 Mikrowellen-Photoconductivity-Verfall-Methode Karriere-Lebensdauer Halbleitermaterial aufgelöste Messung mangels Charakterisierung Oberfläche Rekombination
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