Low Temperature Afm Stm
Low Temperature Afm Stm - Related Videos
08:21
Quantitative Hardness Measurement by Instrumented AFM-indentation
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Cited by 6 •
2016
This experimental protocol describes how atomic force microscopy can be used to measure hardness at the true nanometer scale and to detect single atomistic plasticity events.
09:47
AFM and Microrheology in the Zebrafish Embryo Yolk Cell
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Cited by 3 •
2017
The lack of tools to measure material properties and tensional parameters in vivo prevents validating their roles during development. We employed atomic force microscopy (AFM) and nanoparticle-tracking to quantify mechanical features on the intact zebrafish embryo yolk cell during epiboly. These methods are reliable and widely applicable avoiding intrusive interventions.
08:29
Au-Interaction of Slp1 Polymers and Monolayer from Lysinibacillus sphaericus JG-B53 - QCM-D, ICP-MS and AFM as Tools for Biomolecule-metal Studies
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Cited by 12 •
2016
To obtain basic information on the sorption and recycling of gold from aqueous systems the interaction of Au(III) and Au(0) nanoparticles on S-layer proteins were investigated. The sorption of protein polymers was investigated by ICP-MS and that of proteinaceous monolayers by QCM-D. Subsequent AFM enables the imaging of the nanostructures.
03:17
Temperature Dependence - Concepts
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2020
Chemical Kinetics The reaction rate is the speed at which a chemical reaction occurs. The reaction rate is defined as the change in concentration of a component in the reaction with time. The speed of a reaction depends on several factors, including the concentration of reactants and the temperature at which the reaction is performed. Each reactant contributes to the speed of the reaction by a specific factor. This relationship is defined by the reaction rate law. Rate Law The rate law is an...
10:50
Temperature Dependence - Student Protocol
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2020
Source: Smaa Koraym at Johns Hopkins University, MD, USA Temperature Dependent Decomposition of Hydrogen PeroxideExpand We suggest that students work in pairs for this experiment. Equipment controls may vary. In this lab, you'll perform a decomposition reaction where a single compound breaks down into two or more simpler products. You will observe the decomposition of hydrogen peroxide into water and oxygen. This decomposition happens very slowly, so you will use iron (III) nitrate as a...
FAQs
Cryogenic operation suppresses thermal noise and reduces unwanted motion in the microscope and sample. This greater stability helps maintain precise tip-sample positioning during scanning, which supports higher-resolution measurements of surface structure and nanoscale defects. It also makes subtle electronic or vibrational features easier to resolve, particularly when engineers need to connect local observations with material or device behavior.
AFM emphasizes forces between a sharp cantilever tip and the surface, making it useful for mapping surface structure and defects. STM instead monitors bias-driven tunneling current between a conductive tip and sample, providing access to local electrical behavior. Using the two approaches therefore supports complementary characterization of physical topography and electronic properties under the same cryogenic environment.
Tip-sample stability is central to resolution because both techniques scan across a surface at very small separations. Thermal noise and motion can disturb that positioning and obscure fine features. Low-temperature operation addresses these sources of instability, while the selected sensing mode determines whether the measurement emphasizes force-based surface information or tunneling-related electronic and vibrational features.
Local electronic and vibrational features reveal behavior that may not be apparent from surface structure alone. Mapping them alongside nanoscale defects helps researchers examine how local variations relate to electrical properties. In engineering studies, this connection is especially valuable for understanding superconductors, quantum materials, thin films, nanostructures, and interfaces within devices.
A typical workflow places the sample and appropriate tip in a cryogenic measurement environment, stabilizes the system at low temperature, and brings the tip into the required scanning position. The instrument then scans the surface while recording force-based AFM information or bias-driven STM current. Researchers interpret the resulting maps to evaluate structure, defects, and local properties.
AFM is the more direct choice when the main objective is to examine surface structure or nanoscale defects through tip-sample forces. STM is better suited when the engineering question centers on local electrical behavior and the sample supports tunneling-current measurements. The choice depends on whether force-based morphology or bias-dependent electronic information is most important.
These techniques help characterize superconductors, quantum materials, thin films, nanostructures, and device interfaces while linking surface features to electrical behavior. The resulting nanoscale information can guide refinement of fabrication and characterization strategies. Cryogenic measurements are particularly useful when thermal motion would otherwise make it difficult to resolve stable local structure or electronic features.
Combining surface-sensitive and local-property information allows researchers to relate defects, interfaces, and other nanoscale features to electrical behavior. That relationship can reveal how fabrication affects a material or device and identify structures requiring further optimization. In practice, the measurements support both detailed characterization and more informed refinement of nanoscale engineering processes.