Kong Boon Yeap

Kong Boon Yeap

Fraunhofer Institute for Ceramic Technologies and Systems

Affiliated withFraunhofer Institute for Ceramic Technologies and SystemsGLOBALFOUNDRIES Fab 8

Research Area

Engineering

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JoVE Journal Publications

ArticleTotal : 1
Year
<em>In Situ</em> Time-dependent Dielectric Breakdown in the Transmission Electron Microscope: A Possibility to Understand the Failure Mechanism in Microelectronic Devices
Publication title

Cited by 1

2015

Other Publications

Article
Year

No publications found