Armand Beyer

Armand Beyer

Globalfoundries Fab 1

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JoVE Journal Publications

ArticleTotal : 1
Year
<em>In Situ</em> Time-dependent Dielectric Breakdown in the Transmission Electron Microscope: A Possibility to Understand the Failure Mechanism in Microelectronic Devices
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Cited by 1

2015

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