Michael T. Postek

Nanoscale Device Characterization Division, National Institute of Standards and Technology

Affiliated withNational Institute of Standards and Technology University of South Florida

Research Area

Biography

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JoVE Journal Publications

ArticleTotal : 1	Year
Publication title	2019

Other Publications

Article	Year
Two-dimensional simulation and modeling in scanning electron microscope imaging and metrology research. Scanning\| PubMed ID: 12166805	2002
Nanotip electron gun for the scanning electron microscope. Scanning\| PubMed ID: 16878784	2006
Real-time scanning charged-particle microscope image composition with correction of drift. Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada\| PubMed ID: 21122194	2011
Modeling for accurate dimensional scanning electron microscope metrology: then and now. Scanning\| PubMed ID: 21630286	2011
Does your SEM really tell the truth?--How would you know? Part 1. Scanning\| PubMed ID: 23427011	2013
Does your SEM really tell the truth? How would you know? Part 2. Scanning\| PubMed ID: 24166540	2014
Comparison of Electron Imaging Modes for Dimensional Measurements in the Scanning Electron Microscope. Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada\| PubMed ID: 27452278	2016
X-Ray Lithography Mask Metrology: Use of Transmitted Electrons in an SEM for Linewidth Measurement. Journal of research of the National Institute of Standards and Technology\| PubMed ID: 28053482	1993
Interlaboratory Study on the Lithographically Produced Scanning Electron Microscope Magnification Standard Prototype. Journal of research of the National Institute of Standards and Technology\| PubMed ID: 28053483	1993
Nanomanufacturing Concerns about Measurements Made in the SEM Part IV: Charging and its Mitigation. Proceedings of SPIE--the International Society for Optical Engineering\| PubMed ID: 28663664	2015
Does Your SEM Really Tell the Truth?-How Would You Know? Part 4: Charging and its Mitigation. Proceedings of SPIE--the International Society for Optical Engineering\| PubMed ID: 28663665	2015
Update on Bio-Refining and Nanocellulose Composite Materials Manufacturing. Proceedings of SPIE--the International Society for Optical Engineering\| PubMed ID: 29225398	2017
Ionizing radiation processing and its potential in advancing biorefining and nanocellulose composite materials manufacturing. Radiation physics and chemistry (Oxford, England : 1993)\| PubMed ID: 29230084	2018
Dielectric spectroscopic studies of biological material evolution and application to paper. Tappi journal\| PubMed ID: 30983693	2018
Innovative Approaches to Combat Healthcare-Associated Infections Using Efficacy Standards Developed Through Industry and Federal Collaboration. Proceedings of SPIE--the International Society for Optical Engineering\| PubMed ID: 31092964	2018