Particle Focusing

Particle focusing is the controlled alignment or concentration of suspended particles into defined positions, streams, or regions, enabling precise fluidic handling and measurement. In microfluidic systems, channel geometry and flow conditions generate forces such as inertial lift, drag, and secondary Dean flow that move particles laterally until they reach stable equilibrium positions; sheath flows can also constrain them hydrodynamically. Engineers use particle focusing to improve the accuracy of flow cytometry, cell sorting, particle counting, and diagnostic devices. By producing uniform trajectories and reducing positional variation, the process supports high-throughput analysis, automated separation, and the design of compact lab-on-a-chip technologies.

Particle Focusing - Related Videos

Research

JoVE Journal - Engineering
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Fabrication and Operation of Acoustofluidic Devices Supporting Bulk Acoustic Standing Waves for Sheathless Focusing of Particles

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Cited by 19 •

2016

Acoustofluidic devices use ultrasonic waves within microfluidic channels to manipulate, concentrate and isolate suspended micro and nanoscopic entities. This protocol describes the fabrication and operation of such a device supporting bulk acoustic standing waves to focus particles in a central streamline without the aid of sheath fluids.

Education

JoVE Science Education - Engineering

Focused Ion Beams

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2023

Source: Sina Shahbazmohamadi and Peiman Shahbeigi-Roodposhti-Roodposhti, School of Engineering, University of Connecticut, Storrs, CT As electron microscopes become more complex and widely used in research labs, it becomes more of a necessity to introduce their capabilities. Focused ion beam (FIB) is an instrument that can be employed in order to fabricate, trim, analyze and characterize materials on mico- and nano-scales in a wide variety of fields from nano-electronics to medicine. FIB...

Subatomic Particles

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2020

Dalton was only partially correct about the particles that make up matter. All matter is composed of atoms, and atoms are composed of three smaller subatomic particles: protons, neutrons, and electrons. These three particles account for the mass and the charge of an atom. The Discovery of the Electron The first clue about the subatomic structure came at the end of the 19th century when J.J. Thomson discovered the electron using a cathode ray tube. This apparatus consisted of a sealed glass...

Research

JoVE Journal - Engineering
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High-speed Particle Image Velocimetry Near Surfaces

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Cited by 20 •

2013

A procedure for studying transient flows near boundaries using high-resolution, high-speed particle image velocimetry (PIV) is described here. PIV is a non-intrusive measurement technique applicable to any optically accessible flow by optimizing several parameter constraints such as the image and recording properties, the laser sheet properties, and analysis algorithms.

Echo Particle Image Velocimetry

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Cited by 10 •

2012

An echo particle image velocimetry (EPIV) system capable of acquiring two-dimensional fields of velocity in optically opaque fluids or through optically opaque geometries is described, and validation measurements in pipe flow are reported.

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