High Throughput Afm
High Throughput Afm - Related Videos
08:21
Quantitative Hardness Measurement by Instrumented AFM-indentation
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Cited by 6 •
2016
This experimental protocol describes how atomic force microscopy can be used to measure hardness at the true nanometer scale and to detect single atomistic plasticity events.
09:47
AFM and Microrheology in the Zebrafish Embryo Yolk Cell
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Cited by 3 •
2017
The lack of tools to measure material properties and tensional parameters in vivo prevents validating their roles during development. We employed atomic force microscopy (AFM) and nanoparticle-tracking to quantify mechanical features on the intact zebrafish embryo yolk cell during epiboly. These methods are reliable and widely applicable avoiding intrusive interventions.
09:44
High-throughput Screening for Chemical Modulators of Post-transcriptionally Regulated Genes
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2015
Here we describe a cell-based reporter gene assay as a valuable tool to screen chemical libraries for compounds modulating post-transcriptional control mechanisms exerted through 3’ UTR.
06:19
High-Throughput Screening to Obtain Crystal Hits for Protein Crystallography
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Cited by 16 •
2023
This protocol details high-throughput crystallization screening, ranging from the 1,536 microassay plate preparation to the end of a 6 week experimental time window. Details are included about the sample setup, the imaging obtained, and how users can perform analyses using an artificial intelligence-enabled graphical user interface to quickly and efficiently identify macromolecular crystallization conditions.
08:29
Au-Interaction of Slp1 Polymers and Monolayer from Lysinibacillus sphaericus JG-B53 - QCM-D, ICP-MS and AFM as Tools for Biomolecule-metal Studies
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Cited by 12 •
2016
To obtain basic information on the sorption and recycling of gold from aqueous systems the interaction of Au(III) and Au(0) nanoparticles on S-layer proteins were investigated. The sorption of protein polymers was investigated by ICP-MS and that of proteinaceous monolayers by QCM-D. Subsequent AFM enables the imaging of the nanostructures.
FAQs
A nanoscale probe mounted on a flexible cantilever scans the surface while feedback regulates the interaction force. This controlled response allows the instrument to track surface structure and measure surface properties without relying on uncontrolled contact. Repeating the scan across many samples turns the same probe-surface interaction into comparable measurements for engineering analysis.
Automation coordinates sample movement, measurement scheduling, and rapid data acquisition, while programmable handling enables a planned sequence rather than manual one-sample-at-a-time operation. Parallel measurements further increase the number of surfaces examined within an experiment. This organization is important when engineers need consistent comparisons across many formulations, processing conditions, or manufactured samples.
Conventional AFM is described as a low-volume approach centered on one sample at a time, whereas high-throughput operation extends the same nanoscale probing principle to many samples. The main distinction is workflow scale: automation, programmable handling, parallel measurements, and rapid acquisition increase sample coverage. Engineers can therefore evaluate trends across a set rather than interpret isolated measurements.
Maintaining a controlled interaction force through feedback stabilizes the probe-surface interaction during scanning. That control supports consistent tracking of nanoscale surface structure and properties, which is essential when measurements from different samples must be compared. In high-throughput studies, consistent interaction conditions help the resulting dataset reflect sample differences rather than changes in measurement behavior.
An engineering workflow begins by arranging multiple samples for programmable handling, then bringing the cantilever-mounted probe to each surface. Feedback maintains controlled force during scanning, and rapid acquisition records the resulting structure or property measurements. Automated sequencing and parallel measurements allow the workflow to proceed across the sample set for later comparison.
High-throughput AFM supports quality control, materials screening, nanofabrication, and characterization of polymers, coatings, thin films, and biological interfaces. It can reveal differences in surface structure or properties among samples, helping teams compare formulations, identify defects, and optimize manufacturing conditions. These uses connect nanoscale measurements with decisions about material selection and process improvement.
Measuring many samples produces datasets that support comparisons across formulations, defects, and manufacturing conditions rather than relying on a single surface. The resulting statistical context helps engineers recognize meaningful differences and evaluate whether a material or process performs consistently. This broader evidence can accelerate materials development by linking nanoscale characterization with screening and optimization decisions.