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Materials Engineering

Crystal Structure Using X-ray Diffraction

Description

X-ray diffraction is a materials science method for finding crystal structure. It uses incident X-rays that strike a sample and scatter from its atoms and molecules. The scattered X-rays are measured by their intensity and scattering angle.

The results are plotted as intensity versus angle. Scien...

Transcript

ืขืงื™ืคื” ืฉืœ ืงืจื ื™ ืจื ื˜ื’ืŸ ื”ื™ื ื˜ื›ื ื™ืงื” ื”ืžืฉืžืฉืช ืœืงื‘ื™ืขืช ื”ืžื‘ื ื” ื”ืื˜ื•ืžื™ ื•ื”ืžื•ืœืงื•ืœืจื™ ืฉืœ ื—ื•ืžืจื™ื. ืœืžื•ืฆืงื™ื ืžื‘ื ื” ื’ื‘ื™ืฉื™, ื”ืชื•ืื ืœืกื™ื“ื•ืจ ืžื™ืงืจื•ืกืงื•ืคื™ ืฉืœ ืื˜ื•ืžื™ื ืฉื—ื•ื–ืจ ืขืœ ืขืฆืžื• ืžืขืช ืœืขืช. ืขืœ ื™ื“ื™ ื”ื™ืžื•ืจ ืžื™ืฉื•ืจื™ื, ื ื™ืชืŸ ืœื™ืฆื•ืจ ืžื‘ื ื” ืชืœืช ืžื™ืžื“ื™ ืฉืœ ืกื™ืžื˜ืจื™ื” ืกืคืฆื™ืคื™ืช.

ืกื™ื“ื•ืจื™ื ืžื‘ื ื™ื™ื ืืœื” ืžื‘ื™ืื™ื ืœื’ื™ืื•ืžื˜ืจื™ื™ืช ืืจื™ื–ื” ืกืคืฆื™ืคื™ืช ื”ืžื›ืชื™ื‘ื” ืืช ื”ืชื›ื•ื ื•ืช ื”ืคื™ื–ื™ืงืœื™ื•ืช ื•ื”ื›ื™ืžื™ื•ืช ืฉืœ ื”ื—ื•ืžืจ. ื›ื’ื•ืŸ ืžื’ื ื˜ื™ื–ืฆื™ื”...

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