Using Neutron Spin Echo Resolved Grazing Incidence Scattering to Investigate Organic Solar Cell Materials

Andrew J. Parnell; Adam Hobson; Robert M. Dalgliesh; Richard A. L. Jones; Alan D. F. Dunbar

doi:10.3791/51129

Utilizzo dello scattering di incidenza di pascolo risolto neutroni Spin Echo per indagare i mater...

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Using Neutron Spin Echo Resolved Grazing Incidence Scattering to Investigate Organic Solar Cell Materials

Utilizzo dello scattering di incidenza di pascolo risolto neutroni Spin Echo per indagare i materiali organici delle celle solari

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06:05 min

January 15, 2014

DOI: 10.3791/51129-v

Andrew J. Parnell¹, Adam Hobson², Robert M. Dalgliesh³, Richard A. L. Jones¹, Alan D. F. Dunbar²

¹Department of Physics and Astronomy,University of Sheffield, ²Department of Chemical and Biological Engineering,The University of Sheffield, ³ISIS Pulsed Neutron and Muon Source Science and Technology Facilities Council,Rutherford Appleton Laboratory

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Overview

This study demonstrates the use of spin echo resolved grazing incidence scattering (SERGIS) as a neutron scattering technique to investigate length scales in irregular thin film samples. The technique was applied to crystallites of [6,6]-phenyl-C61-butyric acid methyl ester, with results corroborated by optical and atomic force microscopy.

Key Study Components

Area of Science

Neutron scattering
Thin film analysis
Polymer solar cells

Background

Neutron scattering techniques are essential for probing material structures.
Irregular structures in thin films can impact device performance.
Optical and atomic force microscopy are conventional methods for structure analysis.
Understanding length scales is crucial for optimizing materials in solar cells.

Purpose of Study

To demonstrate SERGIS as a viable method for probing irregular structures.
To correlate neutron scattering results with conventional microscopy findings.
To enhance understanding of the structural properties of polymer solar cell materials.

Methods Used

Preparation of irregular thin film samples.
Application of SERGIS to measure length scales.
Use of optical microscopy for initial structure assessment.
Utilization of atomic force microscopy for confirmation of results.

Main Results

Length scales measured by SERGIS matched those obtained from microscopy.
Results confirmed the effectiveness of SERGIS in analyzing irregular structures.
Demonstrated the potential of neutron scattering in materials science.
Provided insights into the structural characteristics of polymer solar cell components.

Conclusions

SERGIS is a promising technique for probing complex material structures.
The study reinforces the importance of correlating different measurement techniques.
Findings contribute to the development of better-performing solar cell materials.

Frequently Asked Questions

What is SERGIS?

SERGIS stands for spin echo resolved grazing incidence scattering, a neutron scattering technique used to analyze material structures.

How does SERGIS compare to traditional microscopy?

SERGIS provides complementary information about length scales in materials that may not be visible through traditional microscopy methods.

What materials were studied in this research?

The study focused on crystallites of [6,6]-phenyl-C61-butyric acid methyl ester.

Why is understanding length scales important?

Length scales influence the performance and efficiency of materials, particularly in applications like solar cells.

What techniques were used to confirm the SERGIS results?

Optical and atomic force microscopy were used to validate the findings from the SERGIS measurements.

Sono stati compiuti progressi nell'utilizzo dello scattering dell'incidenza di pascolo risolto dall'eco di spin (SERGIS) come tecnica di scattering neutronico per sondare le scale di lunghezza in campioni irregolari. Cristalliti di [6,6]-fenil-C61-estere metile acido butirrico sono stati sondati usando la tecnica SERGIS e i risultati confermati dalla microscopia a forza ottica e atomica.

L'obiettivo generale del seguente esperimento è dimostrare che i neutroni ruotano, l'eco risolve lo spandimento dell'incidente di radente. Suris può essere utilizzato per sondare le scale di lunghezza presenti in campioni irregolari di film sottile, come lo strato attivo all'interno delle celle solari polimeriche. Ciò si ottiene preparando campioni adeguati che hanno strutture irregolari come seconda fase.

Le scale di lunghezza di queste strutture sono misurate utilizzando tecniche convenzionali di microscopia ottica e a forza atomica per confermare la presenza di strutture irregolari. Le successive misurazioni del neutron suris vengono effettuate utilizzando i campioni preparati. Si ottengono risultati che mostrano che le scale di lunghezza osservate negli esperimenti di suris corrispondono ai risultati della microscopia convenzionale.

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