電子顕微鏡の概要

Electron microscopes use an electron beam with a wavelength of 0.005 nanometers instead of visible light, which has a wavelength of 500 nanometers. This shorter wavelength allows electron microscopes to magnify objects up to 2 to 50 million times, compared to light microscopes' maximum of 2,000 times. This superior magnification enables visualization of subcellular structures and some molecular structures like DNA strands.

Transmission electron microscopes (TEM) transmit electrons through an ultrathin sample to generate 2D images revealing internal composition and structure. Scanning electron microscopes (SEM) scan the sample's surface with an electron beam and use reflected electrons to create 3D topography information. TEM requires samples 20-100 nanometers thick, while SEM can image larger objects and surface details of smaller samples.

Air molecules can deflect the electron beam, disrupting image formation and reducing resolution. Maintaining a vacuum inside the electron microscope ensures the electron beam travels unobstructed from the electron-emitting filament through the electromagnetic lenses to the sample. This controlled environment is essential for achieving the high magnification and resolution that electron microscopes provide.

TEM samples must be ultrathin (20-100 nanometers), dehydrated, and often stained with electron-dense heavy metals to enhance contrast. SEM samples are typically dried, treated with fixatives to reduce artifacts, and sputter-coated with a thin metal layer such as gold. These preparation methods reflect each technique's requirements: TEM needs thin sections for electron transmission, while SEM requires conductive surfaces for surface imaging.

Electromagnetic lenses focus the electron beam onto the sample, similar to how glass lenses focus light in optical microscopes. An electron-emitting filament generates the electron beam, which is then directed and concentrated by these magnetic lenses. This focusing capability is critical for achieving the precise magnification and resolution needed to visualize subcellular and molecular structures.

TEM images reveal internal composition and ultrastructure of samples by showing how electrons are transmitted through different regions. Varying opacity in different sample areas creates contrast in the 2D image, allowing visualization of organelles, membrane interiors, and molecular structures. Heavy metal staining enhances this contrast, making internal cellular details clearly distinguishable in the final image.

SEM scans the sample's surface with an electron beam, which knocks electrons off the specimen. These reflected electrons are detected and used to generate detailed 3D surface topography information displayed on a monitor. This technique is particularly useful for examining surface features of larger objects like pollen grains or the detailed surfaces of very small samples.