XPS Surface Analysis of Materials

X-ray photoelectron spectroscopy, or XPS, is a surface analysis method for studying materials. It measures elemental composition, empirical formula, chemical state, and electronic state of the elements in a sample. Because the signal comes from the top few nanometers, XPS is especially useful for examining surfaces.

X-ray photoelectron spectroscopy, or XPS, is an non-destructive technique that can be used to measure the surface chemistry of a material. In XPS, an X-ray of known energy strikes an atom. A core shell electron absorbs the X-ray photon, gaining enough energy to leave its orbit.

Excess energy absorbed by the electron remains as its kinetic ...