SEM Imaging of Conductive Samples

Scanning electron microscopy, or SEM, uses electrons to create detailed images of conductive samples. It is a powerful tool for seeing surface features at magnifications that are much higher than a traditional light microscope can reach. Modern light microscopes can reach about 1,000X, while a typical SEM can reach more than...

Scanning electron microscopy, or SEM, is a powerful technique used in chemistry and material analysis that uses a scanned electron beam to analyze the surface structure and chemical composition of a sample.

Modern light microscopes are limited by the interaction of visible light waves with an object, called diffraction. The smallest resolv...