Demonstration of key methods for high throughput leaf measurements. These methods can be used to accelerate leaf phenotyping when studying many plant mutants or otherwise screening plants by leaf phenotype.
Method Article
* These authors contributed equally
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| Name | Company | Catalog Number | Comments |
|---|---|---|---|
| far-red light LED | Orbitec | custom made | |
| transparency | IKON | HSCA/5 | |
| scanner | Epson | Epson Perfection V700 PHOTO | |
| Image J | NIH | http://rsbweb.nih.gov/ij/ | |
| LeafJ | custom | http://www.openwetware.org/wiki/Maloof_Lab | |
| Air Display | Avatron Software Inc. | http://avatron.com/ | |
| iPad2 | Apple Inc. | http://www.apple.com/ |
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