Method Article

In Situ SIMS and IR Spectroscopy of Well-defined Surfaces Prepared by Soft Landing of Mass-selected Ions

DOI:

10.3791/51344

June 16th, 2014

In This Article

Summary

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Soft landing of mass-selected ions onto surfaces is a powerful approach for the highly-controlled preparation of novel materials. Coupled with analysis by in situ secondary ion mass spectrometry (SIMS) and infrared reflection absorption spectroscopy (IRRAS), soft landing provides unprecedented insights into the interactions of well-defined species with surfaces.

Abstract

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Soft landing of mass-selected ions onto surfaces is a powerful approach for the highly-controlled preparation of materials that are inaccessible using conventional synthesis techniques. Coupling soft landing with in situ characterization using secondary ion mass spectrometry (SIMS) and infrared reflection absorption spectroscopy (IRRAS) enables analysis of well-defined surfaces under clean vacuum conditions. The capabilities of three soft-landing instruments constructed in our laboratory are illustrated for the representative system of surface-bound organometallics prepared by soft landing of mass-selected ruthenium tris(bipyridine) dications, [Ru(bpy)3]2+ (bpy = bipyridine), onto carboxylic acid terminated self-assembled monolayer surfaces on gold (COOH-SAMs). In situ time-of-flight (TOF)-SIMS provides insight into the reactivity of the soft-landed ions. In addition, the kinetics of charge reduction, neutralization and desorption occurring on the COOH-SAM both during and after ion soft landing are studied using in situ Fourier transform ion cyclotron resonance (FT-ICR)-SIMS measurements. In situ IRRAS experiments provide insight into how the structure of organic ligands surrounding metal centers is perturbed through immobilization of organometallic ions on COOH-SAM surfaces by soft landing. Collectively, the three instruments provide complementary information about the chemical composition, reactivity and structure of well-defined species supported on surfaces.

Introduction

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Soft landing of mass-selected ions onto surfaces remains a subject of current research interest due to the demonstrated capabilities of the technique for the highly-controlled preparation of novel materials1-6. Recent efforts have indicated potential future applications of soft landing of mass-selected ions in the preparation of peptide and protein arrays for use in high-throughput biological screening7,8, separation of proteins and conformational enrichment of peptides9-12, covalent attachment of peptides to surfaces9,10,13,14, chiral enrichment of organic compounds15, electrochemical characterization of specific....

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Protocol

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1. Preparation of COOH-SAM Surfaces on Gold for Soft Landing of Mass-selected Ions

  1. Obtain flat gold substrates on silicon (Si) or mica backing materials. Alternatively, prepare gold films on Si or mica surfaces according to procedures described in the literature118,119. Note: Use surfaces that have the following specifications: 1 cm2 or circular and 5 mm in diameter, 525 µm thick Si layer, 50 Å thick Ti adhesion layer, 1,000 Å Au layer.
  2. Place fresh gold-on-silicon surfaces into glass scintillation vials and immerse in pure (non-denatured) ethanol.
  3. Place scintillation vials containing gold ....

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Results

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1. Investigating the Reactivity of Ru(bpy)32+ on COOH-SAMs Using In Situ TOF-SIMS

Soft landing of mass-selected organometallic ions onto functionalized SAMs is first illustrated using in situ TOF-SIMS to provide maximum sensitivity toward detection of adducts formed between the deposited ions and the individual molecules in the monolayers as well as any products of chemical reactions following exposure of the surfaces to reactive gases. The doubly charged .......

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Discussion

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Soft landing of mass-selected ions is generally conducted employing unique custom-built instrumentation that exists in several laboratories around the world that are specially equipped for these experiments. Modifications are constantly being made to these instruments to facilitate the ionization of a wider array of compounds, to achieve larger ion currents and shorter deposition times, to multiplex soft landing and thereby achieve simultaneous deposition of several species at different locations on the surface, and to a.......

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Disclosures

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The authors have nothing to disclose.

Acknowledgements

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This research was funded by the Office of Basic Energy Sciences, Division of Chemical Sciences, Geosciences & Biosciences of the U.S. Department of Energy (DOE). GEJ acknowledges support from the Linus Pauling Fellowship and the Laboratory Directed Research and Development Program at the Pacific Northwest National Laboratory (PNNL). This work was performed using EMSL, a national scientific user facility sponsored by the Department of Energy's Office of Biological and Environmental Research and located at PNNL. PNNL is operated by Battelle for the U.S. DOE.

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Materials

List of materials used in this article
NameCompanyCatalog NumberComments
Gold on Silicon Substrates 1 cm2Platypus TechnologiesAu.1000.SL1custom 
Gold on Silicon Substrates 4.8 mm diameter circularSPI Supplies4176GSW-AB 
Glass Scintillation VialsFisher Scientific03-337-14 
Non-denatured EthanolSigma-Aldrich459836-1L 
Ultraviolet CleanerBoekel Scientific 
16-Mercaptohexadecanoic AcidSigma-Aldrich448303-5G 
Hydrochloric AcidSigma-Aldrich320331-500ML 
Aluminum FoilSigma-AldrichZ185140-1EA 
Metal Forceps/TweezersWiha49185 
Nitrile GlovesFisher ScientificS66383 
Tris(2,2′-bipyridine)dichlororuthenium(II) hexahydrateSigma-Aldrich224758-1G 
MethanolSigma-Aldrich322415-1L 
1 ml Gas Tight Glass SyringeHamilton 
Syringe PumpKD Scientific100 
360 μm ID Fused Silica CapillaryPolymicro TechnologiesTSP075375 
High Resistance ElectrometerKeithley6517A 
Commercial TOF-SIMS InstrumentPhysical ElectronicsTRIFT 
Ultra High Purity OxygenMathesonG1979175 
Research Purity EthyleneMathesonG2250178 
Cesium Ion SourceHeat Wave Labs101502 
Commercial FTIR SpectrometerBrukerVertex 70 

References

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  1. Gologan, B., Green, J. R., Alvarez, J., Laskin, J., Cooks, R. G. Ion/surface reactions and ion soft-landing. Physical Chemistry Chemical Physics. 7, 1490-1500 (2005).
  2. Perez, A., et al. Functional nanostructures from clusters. Int J Nanotechnol. 7, 523-574 (2010).

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Tags

Surface AnalysisOrganometallic IonsSelf Assembled MonolayerTime of Flight SIMSFT ICR SIMSInfrared Reflection Absorption Spectroscopy

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