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Step 1) Selective etching of SrTiO3 and DyScO3 substrates
Atomic force microscopy (AFM) is a straightforward way to obtain an indication about the success of the treatment. The AFM image of an SrTiO3 substrate which had only been flashed to 650 °C (Figure 4A) shows a rough surface, demonstrating the necessity of a high temperature annealing step. The AFM data of an annealed substrate (Figures 4A-C) clearly show two surface terminations, since clear contrast in the friction image is observed, as well as half unit cell height differences in a cross section of the height image. Figure 5 shows AFM images of TiO2 terminated SrTiO3 substrates, which were treated according to the method described in this protocol. On large scale, straight terrace ledges can be observed (Figure 5A). On smaller scale, very smooth terraces are observed, and only unit cell height differences between the terraces are measured, as expected for single terminated surfaces. On substrates with larger terraces, i.e., with smaller miscut angles, unit cell deep holes are visible near the terrace ledges (Figure 5B). These holes disappear when longer annealing times are used, leading to morphologies similar to single terminated substrates with higher miscut angles (Figure 5C). The morphology of these holes, as well as the morphology of the terrace ledges, are an important indication of single termination.24 On single terminated substrates, the holes are circular shaped, while the terrace ledges are rounded. In contrast, sharp-edged terrace ledges and square holes are visible on double terminated substrates (see Figure 4B).
Another indication of single termination appears in reflection high-energy electron diffraction (RHEED) images, as shown in Figure 6. In RHEED images of as received substrates, streaks appear due to poor crystallinity of the surface. After annealing in oxygen or full treatment of the substrate, the surface is more ordered, as can be seen by the appearance of Kikuchi lines and sharp diffraction spots. However, in the case of single terminated substrates, the diffraction spots are even smaller compared to substrates that are only annealed. More important, besides the (1x1) spots, no additional spots are visible, which are always present in patterns of double terminated substrates
In the case of DyScO3, it is more difficult to see whether or not a treatment is successful. No differences can be seen between RHEED patterns of annealed double terminated substrates and chemically treated ScO2 terminated substrates.10 In Figure 7, AFM images of different annealed DyScO3 substrates are shown. Different terminations can easily be seen in Figure 7A-D. Figure 7E and F show the morphology expected for single terminated substrates, i.e. only 4 Å steps are visible. However, the mixed termination can still occur at very small scale. Due to the limited resolution of the AFM, the areas of different terminations are not clearly visible. Higher surface roughness in both height and phase images compared to single terminated surfaces are an indication of the presence of both terminations.
Scanning probe microscopy and surface diffraction techniques are not sufficient to completely determine the success of a treatment. Minor regions of the second termination may not be observed with both types of techniques due to limited resolution. However, these minor regions can have a dramatic influence on the quality of the film, as shown in Figure 8. The nucleation of SrRuO3 is very sensitive towards surface termination.3–5 Although the AFM images of the DyScO3 and SrTiO3 substrates in respectively Figure 8C and F seemed to show single terminated surfaces, growth of SrRuO3 shows that regions of the other termination were still present. In the end, the success of a treatment can only be fully determined considering the quality of the grown film.
Step 2) Deposition of Ca2Nb3O10- nanosheets on arbitrary substrates
During nanosheet deposition, the change in surface pressure can be monitored and this gives an indication on how the deposition proceeds. Typical plots of the surface pressure during the initial surface area compression and the actual deposition of nanosheets are shown in Figure 9. The pressure generally increases for an increasingly dense packing of floating nanosheets and increases more rapidly as the packing density approaches 100%. The actual deposition should start just before the surface pressure reaches its maximum and this pressure will be maintained throughout the deposition. In case the pressure passes its maximum and (slightly) collapses, this could indicate that the high compressing force caused the edges of some nanosheets to overlap each other and create (partial) stacks. As long as the pressure does not approach a maximum, the nanosheets are not yet organized into a dense packing. During the actual deposition, the barriers slowly move back and forth to enable local reorganization of the nanosheet monolayer and this causes a saw-like pressure profile.
A typical AFM image of a monolayer of nanosheets is shown in Figure 10. The nanosheet surfaces are smooth and the height difference with adjacent gaps approaches the 1.44 nm crystallographic thickness of Ca2Nb3O10- layers in their parent compound11. A monolayer of nanosheets is fully (001) oriented in the out-of-plane direction, but has a random in-plane orientation due to the random in-plane ordering of nanosheets. To illustrate their crystal orientations and quality, Figure 11 shows an electron backscatter diffraction (EBSD) image of epitaxial SrRuO3 grown on Ca2Nb3O10- nanosheets with an intermediate layer of SrTiO3. The film has an out-of-plane (001) orientation on all nanosheets and has a single in-plane orientation on individual nanosheets. The surface morphology of such films is illustrated with the AFM image in Figure 12.The step heights in the continuous parts correspond either with the nanosheet thickness or with the unit cell height of SrRuO3, confirming high quality film growth on atomically perfect nanosheets. For an extended report on the properties of epitaxial SrRuO3 films grown by this approach, please refer to Nijland et al.15

Figure 1. (A) Schematic representation of a cubic perovskite unit cell. The metal ions A and B are located in, respectively, the corners and center of the unit cell. The oxygen atoms are located at the faces of the cube, forming an octahedron around the B ion. (B) Schematic representation of a (001) oriented perovskite substrate. Due to a miscut, the surface consists of terraces. Both terminations, AO and BO2, are present at the surface. (C) Schematic representation of a completely BO2 terminated substrate. (D) AFM image of the surface of a DyScO3 substrate after annealing at 1,000 °C for 4 hr. The roughness on the terraces is caused by the presence of two surface terminations, as shown in the line profile (E), where not only the 4 Å unit cell steps, but also 2 Å height differences are visible. Figures A-C are adapted from Kleibeuker et al.9 Please click here to view a larger version of this figure.

Figure 2. Schematic representation of the delamination of a layered parent compound into unilamellar nanosheets. Ion exchange with bulky molecules causes the structure to swell and reduces the interlayer electrostatic forces, allowing the layers to be separated from each other. Please click here to view a larger version of this figure.

Figure 3. Schematic representation of nanosheet deposition by the LB method. The nanosheets float towards the surface of the dispersion and are compressed into a dense packing by the barriers moving inward. The substrate is then slowly withdrawn from the dispersion. Please click here to view a larger version of this figure.

Figure 4. (A) AFM image of an SrTiO3 substrate which had been flashed to 650 °C. (B) AFM height and (C) friction image of a double terminated SrTiO3 substrate, showing sharp step edges and terraces with half a unit cell height difference compared to the adjacent terraces, as visible in the line profile of the AFM height image shown in (D). The two different terminations cause a clear contrast in the friction image. Figure taken with permission from Koster et al.8 Please click here to view a larger version of this figure.

Figure 5. (A-C) AFM images of single terminated SrTiO3 substrates. (D) is a line profile of (C), showing only unit cell height differences. The circle in (B) indicates one of the unit cell deep holes which are visible near the terrace ledges of substrates with low miscut angles. Figure taken with permission from Koster et al.24 Please click here to view a larger version of this figure.

Figure 6. RHEED images of (A) an as received SrTiO3 substrate, (B) an annealed substrate and (C) a single terminated SrTiO3 substrate. Figure taken with permission from Koster et al.24 Please click here to view a larger version of this figure.

Figure 7. AFM images of annealed DyScO3 substrates. (A-D) show clearly double terminated surfaces. However, the morphology can vary from substrate to substrate. The surfaces of (E) and (F) look more homogenous, and only unit cell height differences can be measured. However, the resolution of the AFM can be too low to measure small areas of a second termination25. Please click here to view a larger version of this figure.

Figure 8. AFM images of SrRuO3 films grown on SrTiO3 and DyScO3 substrates. The films in (A) and (D) are grown on respectively SrTiO3 and DyScO3 substrates which were treated according to the methods described in this protocol. The films are very smooth, and the corresponding line profiles shown in (B) and (E) show only unit cell height differences. The films in (C) and (F) were grown on double terminated annealed substrates. Trenches are visible which are in the range of the film thickness. The insets in (D) and (F) show the substrate before growth. Note that both surfaces are very smooth. Figure taken with permission from Kleibeuker et al.9 Please click here to view a larger version of this figure.

Figure 9. Typical plots of the surface pressure during the initial surface area compression and the actual deposition of Ca2Nb3O10- nanosheets. Please click here to view a larger version of this figure.

Figure 10. Typical AFM image and line profile of a monolayer of Ca2Nb3O10- nanosheets deposited on a silicon substrate. The nanosheets display smooth surfaces. Please click here to view a larger version of this figure.

Figure 11. EBSD image of epitaxial SrRuO3grown on Ca2Nb3O10- nanosheets with an intermediate layer of SrTiO3. The film has an out-of-plane (001) orientation on all nanosheets and has a single in-plane orientation on individual nanosheets. Please click here to view a larger version of this figure.

Figure 12. AFM image and line profile of epitaxial SrRuO3 grown on Ca2Nb3O10- nanosheets with an intermediate layer of SrTiO3. Step heights in the continuous parts match the nanosheet thickness of 1.4 nm and the SrRuO3 unit cell height of 0.4 nm. Please click here to view a larger version of this figure.