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The aerosol-assisted CVD of ZnCl2 dissolved in ethanol leads to the formation of greyish uniform and adherent films on bare silicon wafers (relatively easily abraded mechanically). Characterization of the films using scanning electron microscopy (SEM) above 8,000X magnification displays quasi-aligned hexagonal shaped ZnO rods with lengths of ∼1,600 and diameters of ∼380 nm (Figure 2). Large errors in the set-point temperature or the presence of temperature gradients along the substrate during the CVD may cause the deposition of other ZnO morphologies (Figure 3) or films with non-uniform structures. In addition, uneven or non-adherent coatings may be related in part to poor temperature control, incorrect adjustment of the flow, and/or the use of a different carrier solvent than that specified in this protocol.
X-ray diffraction (XRD) analysis of the rods shows diffraction patterns associated with a hexagonal ZnO phase (P63mc space group, a = 3.2490 Å, b = 3.2490 Å, and c = 5.2050 Å; ICCD Card No. 5-0664). These patterns display a high intensity diffraction peak at 34.34° 2θ, corresponding to the (002) plane of the hexagonal ZnO phase, along with other seven low intensity diffraction peaks at 31.75, 36.25, 47.54, 56.55, 62.87, 67.92, and 72,61° 2θ, corresponding to the (100) (101) (102) (110) (103) (201) and (004) planes of the hexagonal ZnO phase, respectively. Characterization of the rods by high-resolution transmission electron microscopy (TEM) shows marked planar spacing (0.26 nm) consistent with the internal lattice of the (002) plane (d = 0.26025 nm) of the hexagonal ZnO phase identified by XRD. Energy-dispersive X-ray (EDX) spectroscopy shows the presence of Zn with relatively low chlorine contamination (found for Cl:Zn 0.05 at.%).
The estimation of the optical bandgap of the rods by means of diffuse reflectance measurements of films indicates an optical bandgap of 3.2 eV, consistent with the literature values for ZnO10. The analysis of the films using X-ray photoelectron spectroscopy (XPS) is characterized by Zn 2p1/2 and Zn 2p3/2 core level peaks spectra at 1,045 and 1,022 eV, respectively, consistent with those observed previously for ZnO11,12.
The use of this protocol on silicon-based micromachined platforms intended for gas sensing lead to the direct integration of columnar ZnO rods confined on the sensing-active area (400 x 400 µm2), which is defined by a shadow mask. The electrical resistance of the films is in the order of kΩ (∼ 100 kΩ) measured at room temperature by using the interdigitated electrodes integrated into the silicon-based micromachined platforms. Figure 4 displays the picture of an array of four micromachined gas sensors based on aerosol-assisted CVD rods. The characteristics and fabrication process for the micromachined platforms have been described previously13. These microsystems are sensitive to relative low concentrations of carbon monoxide, with the maximum responses recorded (using a continuous gas flow test chamber13) when the sensors were operated at 360 °C using the resistive microheaters integrated in the system (Figure 5).

Figure 1: Schematic View of the Aerosol-assisted CVD System.

Figure 2: Top (A) and Cross-sectional (B) SEM Images of the ZnO Rods Deposited via Aerosol-Assisted CVD. Please click here to view a larger version of this figure.

Figure 3: Cross-sectional SEM Images of ZnO Deposited via Aerosol-assisted CVD at 300 (A), 400 (B), 500 (C), and 600 °C (D). Please click here to view a larger version of this figure.

Figure 4: Silicon-based Micromachined Platform with 4 Microsensors Mounted on a TO8-package (A), and Detailed View of a Microsensor (B) and the ZnO Rods Deposited on the Edge of an Electrode (C). Please click here to view a larger version of this figure.

Figure 5: Electrical Resistance Changes of the ZnO Rods Towards Various Concentrations (25, 20, 10 and 5 ppm) of Carbon Monoxide. Please click here to view a larger version of this figure.