Method Article

Fabrication of Flexible Image Sensor Based on Lateral NIPIN Phototransistors

DOI:

10.3791/57502

⸱

June 23rd, 2018

In This Article

Summary

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We present a detailed method to fabricate a deformable lateral NIPIN phototransistor array for curved image sensors. The phototransistor array with an open mesh form, which is composed of thin silicon islands and stretchable metal interconnectors, provides flexibility and stretchability. The parameter analyzer characterizes the electrical property of the fabricated phototransistor.

Abstract

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Flexible photodetectors have been intensely studied for the use of curved image sensors, which are a crucial component in bio-inspired imaging systems, but several challenging points remain, such as a low absorption efficiency due to a thin active layer and low flexibility. We present an advanced method to fabricate a flexible phototransistor array with an improved electrical performance. The outstanding electrical performance is driven by a low dark current owing to deep impurity doping. Stretchable and flexible metal interconnectors simultaneously offer electrical and mechanical stabilities in a highly deformed state. The protocol explicitly describes the fabrication process of the phototransistor using a thin silicon membrane. By measuring I-V characteristics of the completed device in deformed states, we demonstrate that this approach improves the mechanical and electrical stabilities of the phototransistor array. We expect that this approach to a flexible phototransistor can be widely used for the applications of not only next-generation imaging systems/optoelectronics but also wearable devices such as tactile/pressure/temperature sensors and health monitors.

Introduction

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Bio-inspired imaging systems can provide many advantages compared to the conventional imaging systems1,2,3,4,5. Retina or hemispherical ommatidia is a substantial component of biological visual system1,2,6. A curved image sensor, which mimics the critical element of animal eyes, can provide a compact and simple configuration of optical systems with low aberrations7. Diverse advancements of f....

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Protocol

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CAUTION: Some chemicals (i.e., hydrofluoric acid, buffered oxide etchant, isopropyl alcohol, etc.) used in this protocol can be hazardous to health. Please consult all relevant material safety data sheets before any sample preparation takes place. Utilize appropriate personal protective equipment (e.g., lab coats, safety glasses, gloves) and engineering controls (e.g., wet station, fume hood) when handling etchants and solvents.

1. Si Doping and Isolation

NOTE: See Figure 1a - 1d.

  1. Prepare a doped SOI wafer by ion implan....

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Results

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Figure 3a and 3b show the designed and fabricated structure of NIPIN PTR considering previous studies2,23. The inset in Figure 3a exhibits a basic I-V characteristic of PTR. The detailed structural parameters of PTR are shown in Figure 3b. The doping process for a Si layer on an SOI wafer was conducted using the ion implantat.......

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Discussion

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The fabrication technology described here contributes significantly to the progress of advanced electronics and wearable devices. The fundamental concepts of this approach use a thin Si membrane and metal interconnectors capable of stretching. Although Si is a brittle and hard material that can easily be fractured, a very thin Si layer can obtain a flexibility26,27. In the case of the metal interconnector, the wavy shape offers stretchability and flexibility

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Disclosures

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The authors have nothing to disclose.

Acknowledgements

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This research was supported by the Creative Materials Discovery Program through the National Research Foundation of Korea (NRF) funded by the Ministry of Science and ICT (NRF-2017M3D1A1039288). Also, this research was supported by the Institute for Information and Communications Technology Promotion (IITP) grant funded by the Korea government (MSIP) (No.2017000709, Integrated approaches of physically unclonable cryptographic primitives using random lasers and optoelectronics).

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Materials

List of materials used in this article
NameCompanyCatalog NumberComments
MBJ3karl sussMJB3 UV400 MASK ALIGNERMask aligner
80 plus RIEOxford instrumentsPlasmalab 80 Plus for RIEICP-RIE
80 plus PECVDOxford instrumentsPlasmalab 80 Plus forPECVD,PECVD
SF-100NDRhabdos Co., Ltd.SF-100NDSpin coater
PolyimideSigma-Aldrich575771Poly(pyromellitic dianhydride-co-4,4′-oxydianiline), amic acid solution
SOI (silicon on insulator) wafer, 8inchSoitecSOI (silicon on insulator) wafer, 8inch8inch SOI Wafer (silicon Thickness: 1.25μm)
AcetoneDuksan Pure Chemicals Co., Ltd.3051Acetone
Isopropyl Alcohol (IPA)Duksan Pure Chemicals Co., Ltd.4614Isopropyl Alcohol (IPA)
Buffered Oxide Etch 6:1Avantor1278Buffered Oxide Etch 6:1
HSD150-03PMisung Scientific Co., LtdHSD150-03PHot plate
AZ5214MicrochemicalAZ5214Photoresist
MIF300MicrochemicalMIF300Developer
SYLGARD184Dow CorningSYLGARD184Polydimethylsiloxane elastomer
Hydrofluoric Acid Duksan Pure Chemicals Co., Ltd.2919Hydrofluoric Acid 
CR-7KMG Chemicals, Inc210023Chrome mask etchant
MFCD07370792Sigma-Aldrich651842Gold etchant

References

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  1. Ko, H. C., et al. A hemispherical electronic eye camera based on compressible silicon optoelectronics. Nature. 454, 748-753 (2008).
  2. Song, Y. M., et al. Digital cameras with designs inspired by the arthropod eye. Nature. 497 (7447), 95-99 (2....

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Tags

Flexible Phototransistor ArrayLateral NIPIN PhototransistorsDeep Impurity DopingStretchable Metal InterconnectorsThin Silicon MembranePlasma Enhanced Chemical Vapor DepositionReactive Ion EtchingHydrofluoric Acid EtchingPolyimide EncapsulationIV Characteristics Measurement

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